Quartz & Oscillateurs


ISO 9001:2008, ISO14001:2004, IECQ/QC080000, AEC-Q200, RoHS, REACH.

Basé à Taïwan, siège et production depuis 2000.

Marchés : Télécom, Mesure, Sans fil, Automobile, Industrie.

* Quartz : CMS - DIP - Ceramic resonators

* Oscillateurs : CMS - Low EMI - LVPECL - LVDS - HCSL - VCXO - 32,768 MHz

*Automotive : Quartz & Oscillateurs AEC Q200




- Basé à Orange (Californie), siège & production depuis 1970.
- ISO-9001 : 2008, AS9100 Rev C, REACH et ROHS 2.
- Oscillateurs jusqu’a MIL-PRF-55310 level B & Quartz  MIL-PRF-3098


o Mission - Quartz, Oscillateurs & Capteurs  :

  • Haute précision & grande stabilité
  • Faible consommation
  • Très faible épaisseur & encombrement
  • Excellente résistance aux chocs et température
  • Faible vieillissement
  • Design et fabrication aux USA.

Lignes de produits :

o Quartz & Oscillateurs de précision :

  • Haute température
  • Grande résistance aux chocs
  • Mise en oeuvre rapide

o Quartz :

  • SMT & Broches de 10 Khz à 250 MHz

 o Oscillateurs :

  • SMT & Broches de 1 Hz à 200 MHz.

o Capteurs vitesse & température :

  • SMT &  Broches de 160 KHz à 350 KHz.

 o Applications :

Défense, Aéronautique, Spatial, Transport & Médical













- Basé à Mechanicsburg (Pennsylvanie) (Groupe STATEK)
- ISO-9001 : 2008, AS9100C, ROHS
- MIL-PRF-55310, MIL-STD-202/883, MIL-E-5400, MIL-M-38510

Mission : Oscillateurs compensés résistants aux environnements

  • Très haute précision & très grande stabilité.
  • De 1Hz à 1GHz.
  • Excellente résistance aux chocs.
  • Température de -55°C à +125°C.
  • Sorties sinusoïdales, CMOS, ECL, PECL & TTL.
  • Faible consommation.
  • Tests électriques & environnementaux extensifs en interne.

Lignes de produits :

  • OCXO (0.005ppm), faible bruit de phase, de 1MHz à 200 MHz.
  • TCXO (0.04ppm), différentes variétés de boîtiers, 20 KHz à 1GHz …
  • VCXO de 50Hz à 200 MHz jusqu’a 100 000G.

Applications :

  • Défense, Aéronautique, Spatial, Instrumentation.








Quality management system in accordance with ISO 9001:2008 since 2008.

Certified by TUEV SUED

100 % Incoming inspection of quality‐critical components (crystals, Hi-Rel components, PCB, etc.)

Pre‐aging (active and passive) of quartz crystals crystals

Thorough intermediate testing (production line)

Computer‐controlled test equipment

100 % final test of key & critical parameters

Screening & testing to ESA, NASA or customer specifications

Optional screening to MIL‐PRF55310 (Level S)

Radiation levels = Total dose of 3 kRad (Si) (LEO) to 100 kRad (Si) (GEO)

Traceability of test and measurement results

Product marking with serial no. and date code

Traceable instrument calibration  



Equipment for Manufacturing
Stencil Printer (Essemtec)
Semi‐Automatic SMD Pick & Place System (Essemtec)
Fully‐automatic SMD Pick & Place System (Essemtec)
Manual Solder Dispenser & SMD assembly station
Convection Reflow Oven (Essemtec)
Solder Sealing stations (Tip Soldering, Hot‐Jet Soldering)
Ultrasonic Cleaning System
Rework stations (Metcal, Weller)
Laminar‐Flowbox (Class 1000 /ISO Class 3)
Resistance Welding Systems (Soudax, Pyramid)
Tape & Reel System
Thermosealing machine (Vacuum and/or N2)
Mechanical tool shop


Markets served
RF & Microwave Industry
Satellite Communication
RF Test & Measurement equipment
Research Institutes
Industrial Electronics
AV Studio equipment


{slider AXTAL Oscillators for Space Applications.}

 Oscillators (PXO, VCXO, TCXO and OCXO) for Space Applications

 Packaged Crystal Oscillators (SPXO, Clocks)
 Voltage Controlled Crystal Oscillators (VCXO)
 Temperature Compensated Crystal Oscillators (TCXO, VC‐TCXO)
 Temperature Stabilized (Ovenized) Crystal Oscillators (OCXO)
 Surface‐Acoustic Wave Oscillators (PSO, VCSO, OCSO)


Radiation Levels
Total Dose of 3 kRad (Si) (LEO) to 100 kRad (Si) (GEO)
Use of suitable radiation resistant add‐on components such as
semi‐conductors from ESA or NASA (or equivalent) QPL or QML lists or other
approved sources. Upscreening if necessary
Use of “swept” quartz material for the quartz resonators
Sweeping is a purification process that removes
certain impurities and thereby improves the
radiation sensitivity of quartz crystals.

Material selection
Material selection based on ECSS‐Q‐ST‐70C and ECSS‐Q‐70‐71
100 % traceable documentation for all components
Quartz crystal units complying to ESA ESCC 3501
Pre‐cap inspection of quartz crystals prior to sealing
100 % incoming inspection of quartz crystal units

Oscillator manufacturing in Clean‐Room
environment (ISO Class 3) in accordance with ECSS‐Q‐ST‐70‐08C and ECSS‐Q‐ST‐70‐38C
Soldering and assembly by ESA certified personnel

Manufacturing (cont‘d)
Pre‐cap inspection of oscillator assembly prior to sealing
Complete traceability of all materials and manufacturing steps

Screening and testing to MIL‐PRF‐55310 (Product Level S), to ESA or NASA or customer specifications

Testing (MIL PRF‐55310 Product Level S)
100 % Group A and B Testing
Group C Testing (Lot Acceptance Test LAT)

Destructive Parts Analysis (DPA) to MIL-STD-1580 (on request)

Final Source Inspection by customer on request

AXIOM6060‐11 – 100 MHz
AXIOM6060‐12 – 120 MHz 
RF: SMA Connector
DC: Micro‐D Connector
LxWxH = 60 x 60 x 30 mm³
Listed in ESA European Preferred products List ( EPPL)

OCXO in COTS Technology for LEO
AXIOM75‐35 – 100 MHz
Through‐hole (THD)
LxWxH = 25,4 x 25,4 x 12,7 mm³

DIL14 and Flatpack package (in preparation)




Geostationary (weather) satellites

100 kRad total dose
FengYun 2 & 4 : AXIOM6060‐11 – 100 MHz
Singapore : AXIOM6060‐12 – 120 MHz

LEO Satellite

10 … 15 kRad total dose
Singapore : AXIOM75‐35 – 100 MHz
VELOX‐PII Pico Satellite

International Space Station ISS

ULN Reference OCXO (USO) 15 kRad : AXIOM6060‐FM – 100 MHz

{slider AXTAL Oscillator Qualification.}

Qualification testing based on IEC 60679‐4, MIL‐PRF‐55310, ESA or Customer Specs
Frequency stability over various parameters
Output waveform & spectrum
Frequency control, linearity, modulation response
Start‐up behaviour, start‐up time
Stabilization time, re‐trace, time‐domain
Phase noise, short term stability (Allan deviation)
G‐sensitivity, Phase noise under vibration
Temperature tests ‐55°C ~ +125°C, activity dips.
Aging tests ‐ passive and active
Leak test
In‐house environmental tests: shock, vibration (sine and random),
temperature shock, High temperature storage etc

{slider AXTAL Products.}

PXO (Fixed‐frequency Oscillators, clocks)
VCXO (Voltage Controlled Oscillators)
TCXO (Temperature Compensated Oscillators),
including VC‐TCXO
OCXO (Oven Controlled Crystal Oscillators),
including VC‐OCXO and DOCXO
SAW Oscillators (PSO, VCSO, OCSO)
Special Frequency Control Modules:
FCXO / PLXO (Phase‐Locked Crystal Oscillators)
Crystal‐Controlled Microwave Oscillators
Gated Crystal Oscillators (Transponder applications)

Oven Controlled AXTAL Oscillators (OCXO)
Use of AT‐ and SC‐cut resonators in Cold‐weld packages
for very low aging / low phase noise down to < ‐183 dBc/Hz
Frequency range up to >200 MHz
High‐Performance OCXO (± 2 ppb stability) in 20x20 mm package
Double Oven Oscillators (DOCXO) for ultimate stability
Fast warm‐up OCXO in DIL14 (CO 02) package
Connectorised OCXO for Microwave applications
OCXO with low G‐sensitivity
OCXO with low phase noise, also under random vibration
OCXO in ruggedised vibration isolated packages
OCXO for Aerospace and for Space Applications

Clock Oscillators (SPXO)
Packaged AXTAL Oscillators (SPXO)
Low phase noise, low jitter
High stability through hermetically sealed resonators
High Output Frequencies (up to >2 GHz) by using
Low Noise Frequency Multiplication
Phase‐Locked Loop (PLL)
SAW resonators (PSO)
Microwave Oscillators for MIL, Satcom & Airborne

Voltage Controlled AXTAL Oscillators (VCXO)
Low phase noise, low jitter
High Frequency VCXO by using
Low Noise Frequency multiplication
Phase‐locked loop
SAW resonators (VCSO)
Wide pulling range up to ±5000 ppm using LGS crystals
Microwave VCXO for MIL, Satcom & Airborne

Temperature Compensated AXTAL Oscillators
Low aging through hermetically sealed resonators
Low phase noise & jitter
High frequency up to >160 MHz
Wide operating temperature range –55°C to 90°C

Special Oscillators
FCXO / PLXO (Phase Locked Crystal Oscillators
Output frequency = M/N∙ Input frequency (PLL)
Internal VC(X)O (AXON20)
Internal OCXO (AXPLO10 and AXPLO100)
Low phase noise, low transfer jitter
Microwave Oscillators
Gated Crystal Oscillators
AXGX90 series @ 950, 1030 MHz, 1090, 1532 MHz connectorised
AXGX10 (BAW) and AXGS10 (SAW): SMD‐package, up to 1532 MHz
AXGT175 (SAW): Temperature Compensated 1030 & 1090 MHz
SAW Oscillators (PSO and VCSO) 500 MHz ~1800 MHz
Multi‐Channel Switchable crystal oscillators
Special Oscillator Modules for MIL applications

Oscillators (PXO, VCXO, TCXO and OCXO) for Space
(OCXO qualified and approved for GEO satellites 100 kRad)
Use of radiation resistant components from ESA or NASA
(or equivalent) QPL or QML lists or other approved sources
Material selection based on ECSS‐Q‐ST‐70C and ECSS‐Q‐70‐71
Usage of quartz crystal resonators manufactured from swept quartz
material for high radiation resistance IAW with ESCC 3501
Oscillator manufacturing in Clean‐Room environment (ISO Class 3)
in accordance with ECSS‐Q‐ST‐70‐08C and ECSS‐Q‐ST‐70‐38C
Pre‐cap inspection of quartz crystal prior to sealing
Soldering and assembly by ESA certified personnel
Pre‐cap inspection of oscillator assembly prior to sealing
Screening and testing to ESA, NASA and customer specifications
Complete traceability of all materials and manufacturing steps
Engineering Models Qualification Models Flight Models LAT Models

Crystal Sensors
Quartz Crystal Microbalances (QCM)
Metallization: silver (Cr‐Ag), Gold (Cr‐Au), or Titanium (Ti)
5 MHz and 6 MHz
“Balzers”‐ or “Maxtek”‐style
High Temperature QCM elements on Langasite (LGS) and Langatate (LGT) > 500°C
Crystal Temperature Sensors
32 kHz tuning fork sensors RKTV206 series
‐ for temperatures up to 300 °C (with quartz)
‐ for up to >400°C with Langasite (LGS)
Thickness‐shear sensors with 90 ~ 100 ppm/K sensitivity
Crystal pressure sensors
High accuracy (0.025% FS) , e.g. for meteorological applications
Pressure transducer modules with temperature transducer
For downhole and industrial applications


Crystal Wafers and Blanks
Langasite (LGS) Wafers
3” (76.2 mm) diameter and 4” (100 mm) diameter, SSP or DSP
Thickness 0.35 mm or 0.5 mm, one‐side or two sides polished
X‐ cut, Y‐cut or special cuts like YXlt/48.5°/26.6°
Langatate (LGT) Wafers
3” (76.2 mm) diameter and 4” (100 mm) diameter, SSP or DSP
Thickness 0.35 mm or 0.5 mm, one‐side or two sides polished
X‐ cut, Y‐cut or special cuts like YXlt/48.5°/26.6°
LGS, LGT and CTGS blanks
various sizes, round, or rectangular or special
LGT and CTGS rings
6 mm ~ 16 mm diameter, 3 mm ~ 6 mm bore
with double‐sided Gold (Cr‐Au) plating
Other crystals from Langasite family
Wafers, blanks, or other shapes
Quartz crystal wafers & rings
3” (76.2 mm) & 4” (100 mm) diameter, AT‐cut, ST‐ cut, X‐ cut, Y‐ cut etc.
Quartz rings for force sensor moduls



{slider AXTAL Consulting.}


Independent Test House and Consulting Company for Services in the field of Quartz Crystal Products, Ceramic Resonators, and Piezo Sensors

AXTAL Consulting offers Consulting Services for application and design of Frequency Control Products (FCP), i.e. quartz crystal units, LGS

and GaPO4 crystal resonators, crystal oscillators, filters, and piezoelectric sensors

AXTAL Consulting helps suppliers and users to optimise the match between product and application, and thus reduces the risk of failures

in the volume application and in the field in an early stage.

AXTAL Consulting provides failure analyses, suggests corrective actions, and assists its customers in process audits of manufacturing lines

AXTAL Consulting is an independent test house for FCP, offering testing, screening and characterization of FCP according to acknowledged

IEC‐, MIL‐, Automotive and ESA Standards, e.g.

measurement of linear and non‐linear electrical parameters,

temperature tests,

phase noise and short‐term stability tests

aging tests

mechanical and environmental tests


AXTAL Consulting executes qualification approvals of

Frequency Control Products based on IEC 60122 and IEC 61178‐2 and ‐3 (crystals),

IEC 60368‐4 (filters)

IEC 60679‐4 (oscillators),

AEC‐Q200 (automotive), and MIL‐PRF‐3098 (crystals) and MIL‐PRF‐55310 (oscillators)

IPC‐610 for workmanship

Crystal Units

Qualification testing based on IEC 61178‐2 & ‐3, AEC‐Q200 and MIL‐PRF‐3098

Test and measurement compliant to IEC 60444‐x

Qualification testing based on IEC 60679‐4 and MIL‐PRF‐55310

Qualification testing based on IEC 60368‐4


AXTAL Test Equipment



 Automatic Temperature Test System for VCXO and TCXO

 Automatic Temperature Test System for OCXO

 Automatic OCXO Test System

 Automatic Aging Test System

 Cyclic‐Power oscillator Stress Test System

 Automatic Oscillator Final Test System

 Phase Noise Test system (Agilent & Aeroflex)

 Frequency & Time Interval Analyser

 Short‐Term Frequency Stability Test System

 Modulation Analyzer (R&S)

 Oscilloscopes (HP/Agilent & Tektronix)

 Spectrum Analyzers (R&S, Tektronix)

 Frequency Counters (HP/Agilent, Philips)

 Network Analyzers (HP5100A, HP3577A)

 Low‐Noise Frequency Synthesizers (R&S)

 Rubidium and Caesium Frequency Standards,

 GPS‐Disciplined Rubidium


Automatic Temperature Test system for

crystals (THD and SMD) with NWA

Automatic & Manual RT Test system for

crystals (THD and SMD) with NWA

Automatic Crystal Test System (Kolinker)

Crystal Test System 8 kHz~200 MHz (Saunders)

Active Crystal Aging System (PRA)


Leak test system (Trio‐Tech)

Burn‐In System

Vacuum Bake‐Out (Heraeus)

Vibration & Shock test System (TIRA)

Temperature Shock Test System (Thermostream)

Inspection systems (Vision Engineering)

Stereo Microscope with camera